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1

Separation and analysis of diffusion and generation components of pn junction leakage current in various silicon wafers

Murakami, Yoshio, Shingyouji, Takayuki

Journal:

Journal of Applied Physics

Year:

1994

Language:

english

File:

PDF, 813 KB

english, 1994

2

Degradation of dielectric breakdown field of thermal SiO2 films due to structural defects in Czochralski silicon substrates

Y. Satoh, T. Shiota, Y. Murakami, T. Shingyouji, H. Furuya

Year:

1996

Language:

english

File:

PDF, 769 KB

english, 1996

3

Transient component of leakage current in silicon pn junctions

Murakami, Yoshio, Shingyouji, Takayuki

Journal:

Applied Physics Letters

Year:

1994

Language:

english

File:

PDF, 256 KB

english, 1994

4

Study of Si Etch Rate in Various Composition of SC1 Solution

H. Kobayashi, J. Ryuta, T. Shingyouji, Y. Shimanuki

Year:

1993

File:

PDF, 439 KB

1993

5

Simulation of light scattering by a particle on a film-coated substrate using coupled-dipole method

Hideyuki Kondo, Tatsuo Yoshinobu, Takayuki Shingyouji, Hiroshi Iwasaki

Journal:

Year:

1996

Language:

english

File:

PDF, 327 KB

english, 1996

6

Simulation of light scattering by a particle on a film-coated substrate using coupled-dipole method

Hideyuki Kondo, Tatsuo Yoshinobu, Takayuki Shingyouji, Hiroshi Iwasaki

Journal:

Year:

1996

Language:

english

File:

PDF, 327 KB

english, 1996

7

Successful resection of schwannoma from an intercostal nerve causing bloody pleural effusion: Report of a case

Jyunichi Morimoto, Takahiro Nakajima, Toshihiko Iizasa, Aki Ishikawa, Hiroki Nishimura, Masato Shingyouji, Meiji Itakura, Akinobu Araki, Makiko Itami, Hideki Kimura

Journal:

Year:

2011

Language:

english

File:

PDF, 364 KB

english, 2011

8

[IEEE 1996 IEEE International SOI Conference Proceedings - Sanibel Island, FL, USA (30 Sept.-3 Oct. 1996)] 1996 IEEE International SOI Conference Proceedings - Effect of annealing sequences on the structure of buried oxide layer in low-dose SIMOX

Sudou, M., Kainuma, M., Arai, K., Takamatsu, M., Nakai, T., Shingyouji, T., Cordts, B.

Year:

1996

Language:

english

File:

PDF, 671 KB

english, 1996

9

Measurement of Organic Matter on Si Wafer by Thermal Desorption Spectroscopy

Okada, Chizuko, Takahashi, Isao, Kobayashi, Hiroyuki, Ryuta, Jiro, Shingyouji, Takayuki

Journal:

Japanese Journal of Applied Physics

Year:

1993

File:

PDF, 412 KB

1993

10

Effect of oxidation ambient on the dielectric breakdown characteristics of thermal oxide films of silicon

Y. Murakami, T. Shiota, T. Shingyouji, H. Abe

Year:

1994

Language:

english

File:

PDF, 626 KB

english, 1994

11

Effects of oxygen-related defects on the leakage current of silicon p/n junctions

Murakami, Yoshio, Satoh, Yuhki, Furuya, Hisashi, Shingyouji, Takayuki

Journal:

Journal of Applied Physics

Year:

1998

Language:

english

File:

PDF, 3.61 MB

english, 1998

12

[IEEE 1991 IEEE International SOI Conference - Vail Valley, CO, USA (1-3 Oct. 1991)] 1991 IEEE International SOI Conference Proceedings - Reduction of dislocations in a SIMOX film by controlling the annealing sequence

Nakai, T., Shinyashiki, H., Shingyouji, T., Yamaguchi, Y., Nishimura, T., Akasaka, Y.

Year:

1991

Language:

english

File:

PDF, 130 KB

english, 1991

13

Effect of bulk microdefects induced in heat-treated Czochralski silicon on dielectric breakdown of thermal SiO2 films

Satoh, Y., Murakami, Y., Furuya, H., Shingyouji, T.

Journal:

Applied Physics Letters

Year:

1994

Language:

english

File:

PDF, 737 KB

english, 1994

14

Room Temperature Annealing Behavior of Copper-Related Deep Levels in P-Type Floating Zone Silicon Wafers

Kurita, Kazunari, Shingyouji, Takayuki

Journal:

Japanese Journal of Applied Physics

Year:

2001

Language:

english

File:

PDF, 308 KB

english, 2001

15

Effect of Interstitial Oxygen on Formation of Amorphous SiO x Layerin Directly Bonded Czochralski Silicon Wafers

Ishigami, Shun-ichiro, Kawai, Yukio, Furuya, Hisashi, Shingyouji, Takayuki, Saitoh, Yuichi

Journal:

Japanese Journal of Applied Physics

Year:

1993

Language:

english

File:

PDF, 355 KB

english, 1993

16

Growth of Native Oxide and Accumulation of Organic Matter on Bare Si Wafer in Air

Okada, Chizuko, Kobayashi, Hiroyuki, Takahashi, Isao, Ryuta, Jiro, Shingyouji, Takayuki

Journal:

Japanese Journal of Applied Physics

Year:

1993

Language:

english

File:

PDF, 467 KB

english, 1993

17

Stress-Enhanced Diffusion of Boron at the Interface of a Directly Bonded Silicon Wafer

Ishigami, Shun-ichiro, Kawai, Yukio, Furuya, Hisashi, Shingyouji, Takayuki

Journal:

Japanese Journal of Applied Physics

Year:

1993

Language:

english

File:

PDF, 236 KB

english, 1993

18

Low Surface Recombination Velocity on Silicon Wafer Surfaces due to Iodine-Ethanol Treatment

K. Kurita, T. Shingyouji

Year:

1999

Language:

english

File:

PDF, 186 KB

english, 1999

19

Time-Dependent Variation of Composition of SC1 Solution

Takahashi, Isao, Kobayashi, Hideyuki, Ryuta, Jiro, Kishimoto, Mikio, Shingyouji, Takayuki

Journal:

Japanese Journal of Applied Physics

Year:

1993

Language:

english

File:

PDF, 148 KB

english, 1993

20

Detection of Bulk Microdefects underneath the Surface of Si Wafer Using Infrared Light Scattering Tomography

Furukawa, Jun, Furuya, Hisashi, Shingyouji, Takayuki

Journal:

Japanese Journal of Applied Physics

Year:

1993

Language:

english

File:

PDF, 518 KB

english, 1993

21

Identification and Quantification of Transition Metal Impurities in Czochralski Silicon Wafers using Microwave Photoconductive Decay Lifetime Measurements

Kurita, Kazunari, Shingyouji, Takayuki

Journal:

Japanese Journal of Applied Physics

Year:

1998

Language:

english

File:

PDF, 549 KB

english, 1998

22

Metal Impurity Trapping Effect by Stress at Edges of Local Oxidation of Silicon Structure

S. Ishigami, S. Ishii, H. Shinyashiki, H. Furuya, T. Shingyouji

Year:

1994

File:

PDF, 1.95 MB

1994

23

A Study of Defect Formation Mechanism at Edges of Local Oxidation of Silicon Structure

S. Ishigami, H. Shinyashiki, H. Furuya, T. Shingyouji

Year:

1994

File:

PDF, 1.11 MB

1994

24

Radial Distribution of Oxygen Precipitates in Czochralski Silicon Single Crystals

H. Sasaki, M. Kadoi, H. Furuya, T. Shingyouji, Y. Shimanuki

Year:

1994

File:

PDF, 542 KB

1994

25

Light Scattering by Submicron Particles on Film-Coated Wafers

H. Kondo, S. Yanagi, K. Takaishi, T. Shingyouji, T. Yoshinobu, H. Iwasaki

Year:

1996

File:

PDF, 526 KB

1996

26

New Endobronchial Ultrasound Imaging for Differentiating Metastatic Site Within a Mediastinal Lymph Node

Nakajima, Takahiro, Shingyouji, Masato, Nishimura, Hiroki, Iizasa, Toshihiko, Kaji, Sachiko, Yasufuku, Kazuhiro, Kimura, Hideki

Journal:

Journal of Thoracic Oncology

Year:

2009

Language:

english

File:

PDF, 1.02 MB

english, 2009

27

Adsorption and Desorption of Contaminant Metals on Si Wafer Surface in SC1 Solution

Maeda, G., Takahashi, I., Kondo, H., Ryuta, J., Shingyouji, T.

Journal:

MRS Proceedings

Year:

1995

Language:

english

File:

PDF, 357 KB

english, 1995

28

[Society of Exploration Geophysicists of Japan Proceedings of the 10th SEGJ International Symposium - Kyoto, Japan (20 November 2011)] Proceedings of the 10th SEGJ International Symposium - Marine Time-domain electromagnetic technologies for the ocean bottom mineral resources

Nakayama, Keiko, Shingyouji, Taisuke, Motoori, Masayuki, Yasui, Mana, Kobayashi, Yasushi, Yamazaki, Atsushi, Saito, Akira

Year:

2011

Language:

english

File:

PDF, 1.10 MB

english, 2011

29

Mass Balance in Tokyo on the basis of Physical Distribution Data.

MORITA, Masaru, OHKAWA, Masaya, SHINGYOUJI, Akio

Journal:

Environmental Systems Research

Year:

1997

File:

PDF, 981 KB

1997

30

2TA4-07 Structural changes in dynein molecules accompanying force generation(The 47th Annual Meeting of the Biophysical Society of Japan)

Ueno, Hironori, Yasunaga, Takuo, Shingyouji, Chikako, Yamaguchi, Takami, Hirose, Keiko

Journal:

Seibutsu Butsuri

Year:

2009

Language:

english

File:

PDF, 247 KB

english, 2009